Abstract: The origin of some time-dependent variability phenomena in FET technologies has been attributed to the charge carrier trapping/detrapping activity of individual defects present in devices.
Whether infection of cells by individual virions occurs randomly or if there is some form (s) of competition or cooperativity between individual virions remains largely unknown for most virus-cell ...
CI&T Inc (CINT) reports a 13.4% revenue increase and strong AI adoption, while navigating pricing model transitions and FX impacts.
Abstract: A synchronous binary counter is one of the basic components widely used in VLSI design, and it is required to be fast and support a wide bit-width in many applications. However, most of the ...
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